Foreign Material

Detection of foreign material on wafer using wafer inspection machine

Edge Debris

Edge Burr

Die Crack

Die Position

Die Placement

Un-separated area on wafer detected during top inspection

Die Chip Off

Edge chipping found during wafer top inspection

Die Scratches

Wafer surface scratches detected by wafer inspection machine

Glue Overflow

Missing Die

Wirebond

Wire Sweep

Missing Wire

Non-Stick on Pad (NSOP)

Non-Stick on Lead (NSOL)

Unbonded

Smashing Bond

Bond Offset

Double Bond

Bond Tail

Broken Wire

Applicable Products

Camera 5MP 65MP
Accuracy ± 7.0μm ± 3.5μm
FOV (H x V)> 8.4mm x 7.0mm 14.9mm x 11.2mm
Magnification 1X 2X

*Specification can be adjusted accordingly*