- Live Feed 32-Channel Monitoring
Measures the voltages of 32 test units individually, sequentially, and continuously in real time.
- Advanced Individual LED Protection
Built with automated over-current and over-temperature shutdown protection for each individual test units channel during high-stress testing.
- Comprehensive Fault Detection
Instantly detects short circuits and open circuits at each test units location in real time.
- Flexible Current Testing
Supports both forward and reverse current testing parameters to ensure thorough electrical evaluation.
- High-Precision Performance
Delivers a monitoring time of 300 ms across all 32 channels with an ultra-tight voltage tolerance of ±0.005 V.
- Customizable System Configuration
Offers a maximum current supply of 1 A per channel, constant voltage burn-in (0–30 V) preset via product recipes, and customizable switching circuit boards tailored to specific application requirements.
- Complete Probing & Hardware Solutions
Includes custom PCB and socket designs along with dedicated probing solutions for component-level testing.
- LED Manufacturing & Packaging Quality Assurance
Widely used in stress testing high-brightness and specialized LEDs to screen out early-life failures (infant mortality) before field deployment.
- Automotive Lighting Component Testing
Deployed to test LED modules and discrete components destined for automotive interior/exterior lighting, ensuring high reliability under continuous thermal and electrical stress.
- Power Semiconductor & Discrete Component Testing
Suitable for testing and stress-screening semiconductor components such as MOSFETs and other power devices.
- Reliability Engineering & R&D Laboratories
Utilized in research and test chambers to evaluate long-term device performance, thermal stability, and electrical degradation under preset constant voltage conditions.
- Consumer & Industrial Electronics Production
Integrated into manufacturing lines that demand rigorous electrical stress screening to guarantee the long-lasting performance of optoelectronic and electronic components. - EV Battery & Power Electronics Testing
Essential for stress-testing EV battery modules, power management systems (BMS), onboard chargers, and high-voltage power semiconductors—supporting Malaysia’s growing position as a regional hub for electric vehicle manufacturing and battery ecosystem development. - Data Center Power & Energy Infrastructure
Ideal for testing high-reliability energy storage systems, backup power supplies (UPS), and power conversion devices—directly catering to Malaysia’s booming data center infrastructure expansion in key hubs like Johor and Selangor.
- Measures voltages of 32 LEDs individually, sequentially, and continuously in Live Feed mode
- Over-current and over-temperature shutdown protection for individual LEDs
- Supports both forward and reverse current testing
- Detects short and open circuits at each LED location in real time
- Monitoring time: 300 ms (32 channels)
- Voltage tolerance: ±0.005 V
- Suitable for semiconductor components (e.g., MOSFETs, etc.)
System Configuration
- Maximum current supply per channel: 1 A
- Burn-in method: Constant voltage (0–30 V) preset via product recipe
- Utilizes a switching circuit board based on the application, which is customizable
- PCB and socket design provided
- Probing solutions available for component-level testing
FAQ
The Burn-In Tester is an advanced test chamber and stress-screening system designed to ensure the long-term reliability and performance of electronic components, particularly LEDs and semiconductor devices like MOSFETs, by subjecting them to continuous electrical and thermal stress.
The tester can individually, sequentially, and continuously measure the voltages of 32 LEDs in real-time “Live Feed” mode with a fast monitoring time of just 300 ms across all channels.
It delivers high-precision accuracy with an ultra-tight voltage tolerance of ±0.005 V.
The system includes automated over-current and over-temperature shutdown protection for each individual LED channel, preventing component damage during high-stress testing. It also performs real-time short circuit and open circuit detection at every LED location.
The system supports a maximum current supply of 1 A per channel and utilizes a constant voltage burn-in method (0–30 V) preset easily via product recipes.
Yes, the tester utilizes a customizable switching circuit board depending on the specific application, and comes complete with custom PCB, socket design, and probing solutions tailored for component-level testing.
