LED Test System

- IPC – Windows Embedded
- Spectrometer
- Source Meter
- Optical Accessories
One Stop Software Solution For

| Electrical Testing |
| Voltage |
| Current |
| Resistance |
| Capacitance |
| Optical Testing |
| Colorimetry |
| Photometry |
| Radiometry |
| Binning |
| ANSI BIN |
| MacAdam BIN |
Wide Range of Hardware Integration Support

Array Spectroradiometers;
Brands supported includes Instrument Systems, Gamma Scientific, OTO, Avantes, etc.

Power Source(e.g. Source meter, AC/DC Meter, Measuring Meter) from Keithley, National instrument, Vektrex, etc.

Integrating Sphere & Optical Probes

Wide Range of Testing Communication Protocol Support

I²C

SWIM

BLE

RS232

SPI

TCPIP

USB

Flexible and Comprehensive

- For integrated to manual station for engineering purposes
- Easily integrated into fully automated equipment for production through various handshaking protocol
Powerful Test Editor For Recipe Creation

- Single / Multiple Chips Testing Mode
- Series / Parallel Test Mode for High Speed machines
- Colour Binning based on ANSI or MacAdam
Production SPC/ Monitoring Control

Real Time acquisition and Data Analysis display

Systematic Data Management

Recommended geometry according to CIE Pub. No. 127

Test time < 90 msec (Near real-time optical measurement)

High sensitivity 2048 pixel CMOS array sensor

NIST- or PTB-traceable calibrations

Advanced binning management for up to 1024 bins

User friendly, scalable test software with flexible, programmable test flows

Application in Sectors

Automation Lighting

General Lighting

Illumination Lighting

Smartphone Lighting

Smart Device Lighting

Horticulture Lighting
Applications :OptoSemiconductors

Sensors

Photo Diode

Photo IC

Ambient Light Sensors

Emitter
Applications: Package Type

SMD

COB Singulated

Panel Board

Camera Flashes

Copper Board

Module

Lead Frame

Light Sheet

TO-5
In House Design Customize Circuit Board

Multiplexer / Matrix Relay Board

High Current Relay Board

Functional Test Board

ADC / DAC Board
Probe Card and Test Socket




Electrical Measurement
- Forward / Reverse Voltage Test
- Forward / Reverse Current Test
- Open / Short Test
- Leakage Test
- Contact Check
- NTC Test
- Resistance Test
- Capacitance Test


Optical Measurement
Colorimetry
- CIExy1931
- CIExy2015
- CIE Lab* Luv*
- Trist X,Y,Z
- CRI (Ra,R1-R16)
- Color Temperature
- Color Purity
- Color Gamut
- Color Fidelity
- Color Quality Scale
- Duv
Photometry
- Luminous Flux
- Luminous Intensity
- Illuminance
- Luminous Efficacy
- Photon
Radiometry
- Radiant Flux
- Radiant Intensity
- Radiance
- Irradiance
Wavelength
- Peak Wavelength
- Centroid Wavelength
- Dominant Wavelength
- FWHM
Others
- Photosynthetic Photon Flux (PPF)
- Biologically-Active Photon Flux (BPF)
- Active PPF (A-PPF)
- Absolute Spectral Distribution (ASD)
| Parameter | Basic Spectrometer | ||
| Optical Measurement | Spectral Range | 350-1020nm | |
| Detector | Sony ILX511B CCD Array, 2048 Pixel | ||
| Resolution | 1.62nm | ||
| Photometric Measurement (Intensity/ Flux) Accuracy | Flux / Intensity | +/- 3% | |
| Reproducibility of Single System | +/- 1% | ||
| Measurement Range | Intensity (10:1 SNR) | 0.004mcd – 2000mcd | |
| Flux (10:1 SNR) | 0.1lm – 5klm | ||
| Photometric Measurement (Intensity/ Flux) Accuracy | Flux / Intensity | +/- 3% | |
| Reproducibility of Single System | +/- 1% | ||
| Colorimetric Measurement Accuracy | Peak Wavelength | +/- 0.3 nm | |
| Dominant Wavelength | +/- 2 nm | ||
| Chromaticity Color Coordinates (x,y) | +/- 0.005 | ||
| Color Correlated Temperature (CCT) | +/- 2% | ||
| Sensitivity | Luminous Intensity (10:1 s:n) | 0.004mcd – 2kcd | |
| Luminous Flux (10:1 s:n) | N/A | ||
| Illuminance Sensitivity (10:1 SNR) | 0.1lux – 50klux | ||
| Measuring Time | 1ms – 65s | ||
| Measuring Time at 1mcd (10:1 SNR) | 40ms | ||
| Dynamic Range | 1300:1 | ||
| Signal to Noise Ratio (SNR) | 250:1 | ||
| Stray Light | <0.15% @ 450nm | ||































