LED Test System

- IPC – Windows Embedded
- Spectrometer
- Source Meter
- Optical Accessories
One Stop Software Solution

| Electrical Testing |
| Voltage |
| Current |
| Resistance |
| Capacitance |
| Optical Testing |
| Colorimetry |
| Photometry |
| Radiometry |
| Binning |
| ANSI BIN |
| MacAdam BIN |
Wide Range of Hardware Integration Support

Array Spectroradiometers;
Brands supported includes Instrument Systems, Gamma Scientific, OTO, Avantes, etc.

Power Source(e.g. Source meter, AC/DC Meter, Measuring Meter) from Keithley, National instrument, Vektrex, etc.

Integrating Sphere & Optical Probes

Wide Range of Testing Communication Protocol Support

I²C

SWIM

BLE

RS232

SPI

TCPIP

USB

Flexible and Comprehensive

- For integrated to manual station for engineering purposes
- Easily integrated into fully automated equipment for production through various handshaking protocol
Powerful Test Editor For Recipe Creation

- Single / Multiple Chips Testing Mode
- Series / Parallel Test Mode for High Speed machines
- Colour Binning based on ANSI or MacAdam
Production SPC/ Monitoring Control

Real Time acquisition and Data Analysis display

Systematic Data Management

Recommended geometry according to CIE Pub. No. 127

NIST- or PTB-traceable calibrations

Test time < 100 msec (Near real-time optical measurement)

Advanced binning management for up to 1024 bins

User-friendly, scalable test software with flexible programmable test flows

Application in Sectors

Automation Lighting

General Lighting

Illumination Lighting

Smartphone Lighting

Smart Device Lighting

Horticulture Lighting
Applications :OptoSemiconductors

Sensors

Photo Diode

Photo IC

Ambient Light Sensors

Emitter
Applications: Package Type

SMD

COB Singulated

Panel Board

Camera Flashes

Copper Board

Module

Lead Frame

Light Sheet

TO-5
In House Design Customize Circuit Board

Multiplexer / Matrix Relay Board

High Current Relay Board

Functional Test Board

ADC / DAC Board
Probe Card and Test Socket




Electrical Measurement
- Forward / Reverse Voltage Test
- Forward / Reverse Current Test
- Open / Short Test
- Leakage Test
- Contact Check
- NTC Test
- Resistance Test
- Capacitance Test


Optical Measurement
Colorimetry
- CIExy1931
- CIExy2015
- CIE Lab* Luv*
- Trist X,Y,Z
- CRI (Ra,R1-R16)
- Color Temperature
- Color Purity
- Color Gamut
- Color Fidelity
- Color Quality Scale
- Duv
Photometry
- Luminous Flux
- Luminous Intensity
- Illuminance
- Luminous Efficacy
- Photon
Radiometry
- Radiant Flux
- Radiant Intensity
- Radiance
- Irradiance
Wavelength
- Peak Wavelength
- Centroid Wavelength
- Dominant Wavelength
- FWHM
Others
- Photosynthetic Photon Flux (PPF)
- Biologically-Active Photon Flux (BPF)
- Active PPF (A-PPF)
- Absolute Spectral Distribution (ASD)
| Parameter | Gamma Scientific Spectrometer (Advanced) | ||
| Optical Measurement | Spectral Range | 360-1100nm | |
| Detector | Cooled-back illuminated 2048 Pixel CCD Sensor | ||
| Resolution | 0.35nm | ||
| Photometric Measurement (Intensity/ Flux) Accuracy | Flux / Intensity | +/- 1% | |
| Reproducibility of Single System | +/- 1% | ||
| Measurement Range | Intensity (10:1 SNR) | 0.002mcd -15kcd | |
| Flux (10:1 SNR) | 0.001mlm -2.400klm | ||
| Photometric Measurement (Intensity/ Flux) Accuracy | Flux / Intensity | +/- 1% | |
| Reproducibility of Single System | +/- 1% | ||
| Colorimetric Measurement Accuracy | Peak Wavelength | +/- 0.1 nm | |
| Dominant Wavelength | +/- 0.5 nm | ||
| Chromaticity Color Coordinates (x,y) | +/- 0.0015 | ||
| Color Correlated Temperature (CCT) | +/- 2% | ||
| Sensitivity | Luminous Intensity (10:1 s:n) | 0.02mcd – 15kcd | |
| Luminous Flux (10:1 s:n) | 1mlm – 240klm | ||
| Illuminance Sensitivity (10:1 SNR) | 0.2mlux – 15klux | ||
| Measuring Time | 2us – 2.67s | ||
| Measuring Time at 1mcd (10:1 SNR) | 40ms | ||
| Dynamic Range | 6670:1 | ||
| Signal to Noise Ratio (SNR) | N/A | ||
| Stray Light | 0.01% | ||




























