Lumeresoft Test Manufacturing View and Test Analyzer
Lumeresoft’s Test Manufacturing View and Test Analyzer View is flexible enough to adapt to the user’s need and preferences in order to provide the best and most concise viewing experience.
Test Manufacturing View
Test Analyzer View
Lumeresoft Test Editor
Test Editor View
Lumeresoft’s flexibility is evidently presented in the Test Editor which allow users to:
- Create Test Page carry a list of Electrical and Optical tests for individual die
- Drag and Drop Test parameters from Toolbox Kit to create Test Flows
- Configure Color Binning based on ANSI (Polygon) or MacAdam functions
- Configure all electrical Test parameters by changing SMU settings and switching board settings
- Perform testing on multiple test sites for high speed machines
Lumeresoft Auto Correlation Mode
Calculates correlation data based on customer supplied Reference Instrument Data of Golden units.
Lumeresoft SPC / Monitoring Mode
Ensure accurate and consistent quality control of testers through meticulous attention to details.
One Stop Software Solution For
| Electrical Testing |
| Voltage |
| Current |
| Resistance |
| Capacitance |
| Optical Testing |
| Colorimetry |
| Photometry |
| Radiometry |
| Binning |
| ANSI BIN |
| MacAdam BIN |
Wide Range of Hardware Integration Support
Array Spectroradiometers;
Spectrometers (Basic/Advanced) utilizing Multi-Element Array CCD Sensors. Compatible with leading brands such as Instrument Systems, Gamma Scientific, OTO, Avantes, and other widely used models.
Power Source (e.g Source meter, AC/DC Meter, Measuring Meter) from Keithley, National instrument, Vektrex, etc.
Standard and Customized Integrating Sphere & Optical Probes PTFE coating for luminous flux (Lumens) measurement
Wide Range of Testing Communication Protocol Support
I²C
SWIM
BLE
RS232
SPI
TCPIP
USB
Flexible and Comprehensive
- As a standalone system, Lumeresoft supports integration to manual stations
- Handshaking protocols for integration into fully automated production equipment
Powerful Test Editor For Recipe Creation
- Single / Multiple Chips Testing Mode
- Series / Parallel Test Mode for High Speed machines
- Color Binning based on ANSI or MacAdam
Auto Correlation Mode and Production SPC/ Monitoring Control
- Calculates correlation data based on customer supplied reference instrument data of golden units to ensure accurate and consistent quality control of testers
Real Time acquisition and Data Analysis display
Systematic Data Management
Spectrometer Specifications
| Parameter | Basic | High-End | |
| Optical Measurement | Spectral Range | 350-1020nm | 360-1100nm |
| Detector | Sony ILX511B CCD Array, 2048 Pixel | Cooled-back illuminated 2048 Pixel CCD Sensor | |
| Resolution | 1.62nm | 0.35m | |
| Photometric Measurement (Intensity / Flux) Accuracy | Intensity / Flux | +/- 3% | +/- 1.5% |
| Reproducibility of Single System | +/- 1% | +/- 1% | |
| Colorimetric Measurement Accuracy | Peak Wavelength | +/- 0.3nm | +/-0.1nm |
| Dominant Wavelength | +/- 2nm | +/- 0.5nm | |
| Chromaticity Color Coordinates (x,y) | +/- 0.005 | +/-Â 0.0015 | |
| Chromaticity Color Coordinates (x,y) | +/- 2% | +/- 2% | |
| Measurement Range | Intensity (10:1 SNR) |
0.004mcd – 2000mcd | 0.002mcd – 15kcd |
| Flux (10:1 SNR) |
0.1lm – 5klm | 0.001mlm – 2,400km | |
| Sensitivity | Luminous Intensity (10:1 s:n) |
0.004mcd – 2kcd | 0.02mcd – 15kcd |
| Luminous Flux (10:1 s:n) |
N/A | 1mlm – 15kcd | |
| Luminous Sensitivity (10:1 SNR) |
0.1lux – 50klux | 0.2mlux – 15klux | |
| Measuring Time | 1ms – 65s | 2us – 2.67s | |
| Measuring Time at 1mcd (10:1 SNR) |
40ms | 40ms | |
| Dynamic Range | 1300:1 | 6670:1 | |
| Signal to Noise Ratio (SNR) | 250:1 | N/A | |
| Stray Light | <0.15% @ 450nm | 0.01% | |
